Mr. Yue Pan Profile

Yue Pan

at RMIT Univ

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Author

Publications (3)

Proceedings Article | 7 December 2013 Paper

A novel single dot test structure for determining specific contact resistivity

Yue Pan, Aaron Collins, Anthony Holland

Proceedings Volume 8923, 89232Q (2013) https://doi.org/10.1117/12.2034077

KEYWORDS: Resistance, Finite element methods, Electrodes, Data modeling, Semiconductors, Metals, Error analysis, Bessel functions, Interfaces, Computer engineering

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Proceedings Article | 7 December 2013 Paper

Investigating extremely low resistance ohmic contacts to silicon carbide using a novel test structure

Yue Pan, Aaron Collins, Fahid Algahtani, Patrick Leech, Geoffrey Reeves, Philip Tanner, Anthony Holland

Proceedings Volume 8923, 892356 (2013) https://doi.org/10.1117/12.2033910

KEYWORDS: Silicon carbide, Resistance, Nickel, Electrodes, Heat treatments, Semiconductors, Metals, Temperature metrology, Bessel functions, Nitrogen

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Proceedings Article | 7 December 2013 Paper

Improved geometrical design of the circular transmission line model ohmic contact test structure

Aaron Collins, Yue Pan, Anthony Holland

Proceedings Volume 8923, 892359 (2013) https://doi.org/10.1117/12.2033920

KEYWORDS: Resistance, Modeling, Statistical analysis, Structural design, Semiconductors, Mathematical modeling, Holographic optical elements, Current controlled current source, Bessel functions, Error analysis

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