Yuuki Abe
at Dai Nippon Printing Co Ltd
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 1 November 2007 Paper
Proceedings Volume 6730, 673045 (2007) https://doi.org/10.1117/12.751244
KEYWORDS: Etching, Line width roughness, Photomasks, Chromium, Cadmium sulfide, Process control, SRAF, Photoresist processing, Diffractive optical elements, Mask making

Proceedings Article | 20 October 2006 Paper
Yuuki Abe, Jumpei Morimoto, Toshifumi Yokoyama, Atsushi Kominato, Yasushi Ohkubo
Proceedings Volume 6349, 634935 (2006) https://doi.org/10.1117/12.692889
KEYWORDS: Etching, Chromium, Anisotropic etching, Quartz, Photomasks, Plasma, Phase shifts, Photoresist processing, Chlorine, Plasma etching

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top