Yvan Dutil
at ABB Analytical Measurement
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 10 November 2003 Paper
Proceedings Volume 5151, (2003) https://doi.org/10.1117/12.505982
KEYWORDS: Fourier transforms, Absorption, Interferometers, Infrared spectroscopy, Imaging systems, Atmospheric particles, Modulation, Infrared radiation, Calibration, Infrared imaging

Proceedings Article | 17 February 2003 Paper
Yvan Dutil, Stephane Lantagne, Robert Poulin
Proceedings Volume 4833, (2003) https://doi.org/10.1117/12.474892
KEYWORDS: Sun, Spectral calibration, Calibration, Fourier transforms, Semiconductor lasers, Absorption, Temperature metrology, Metrology, Doppler effect, Satellites

Proceedings Article | 18 December 2002 Paper
Robert Poulin, Stephane Lantagne, Yvan Dutil, Steve Levesque, Francois Chateauneuf
Proceedings Volume 4818, (2002) https://doi.org/10.1117/12.458123
KEYWORDS: Calibration, Printed circuit board testing, Sensors, Spectral calibration, Interferometers, Neon, Laser metrology, Metrology, Semiconductor lasers, Medium wave

Proceedings Article | 24 September 2002 Paper
Yvan Dutil, Stephane Lantagne, Simon Dube, Robert Poulin
Proceedings Volume 4814, (2002) https://doi.org/10.1117/12.451779
KEYWORDS: Fourier transforms, Sensors, Data processing, Spectral calibration, Transmittance, Modulation, Process control, Calibration, Interferometers, Satellites

Proceedings Article | 31 May 1994 Paper
Proceedings Volume 2201, (1994) https://doi.org/10.1117/12.176039
KEYWORDS: Mirrors, Sensors, Adaptive optics, Electrodes, Astronomy, Device simulation, Telescopes, Turbulence, Optical simulations, Wavefronts

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