Zhehan Li
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 8 December 2022 Paper
Proceedings Volume 12480, 124800C (2022) https://doi.org/10.1117/12.2660169
KEYWORDS: Ellipsometry, Surface roughness, Polarization, Refractive index, Optical testing, Neodymium, Polarizers, Scanning electron microscopy, Reflection, Ranging

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