Zhipeng Pan
Undergraduate at Univ of Electronic Science And Technology of China
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 10 January 2018 Paper
Proceedings Volume 10616, 1061617 (2018) https://doi.org/10.1117/12.2295088
KEYWORDS: Cameras, Imaging systems, Calibration, Projection systems, Fringe analysis, 3D metrology, Complex systems, Phase shifting, Optoelectronic devices, CCD cameras

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