The vertical structure (VS) in nanosheet is important to electrical application because the VS in nanosheet determines the efficiency of solar cells, electrochemical biosensors and etc. The scanning electron microscopy (SEM) provides a way to observe the nanosheet structure; however, the identification of the structure is inaccuracy and when just from human justification. Deep learning gives an efficient method to identification and segmentation in an SEM image, which will enhance the precision. And the identification of VS is beneficial to get the relationship between the VS and electrical application from statistical viewpoint. In this paper we design a deep learning framework to detect the VS in the ZnO nanosheet, which overcomes two issues in the SEM: (i) the intensity inhomogeneity issue; (ii) the interference issue which is caused by other nano structures. And the experimental results exhibit height performance.
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