Dr. Zhouling Wu Profile

Dr. Zhouling Wu

President and CEO at ZC Optoelectronic Technologies Ltd

SPIE Involvement:

Author

Publications (67)

Proceedings Article | 23 December 2023 Paper

Progress on defect inspection for large-aperture optics

Jian Chen, Jianda Shao, Ming Huang, Shijie Liu, Zhouling Wu

Proceedings Volume 12982, 129820W (2023) https://doi.org/10.1117/12.3021253

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Proceedings Article | 8 July 2019 Paper

Fast measurement technique for obtaining the low damage threshold defects in a large aperture fused silica glass

Shenghao Wang, Lingqiao Li, Zhan Sui, Jianda Shao, Shijie Liu, Zhouling Wu, Jian Chen, Ming Huang

Proceedings Volume 11063, 110630Y (2019) https://doi.org/10.1117/12.2539370

KEYWORDS: Laser damage threshold, Fused quartz, Spectrum analysis, Defect detection

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Proceedings Article | 21 June 2019 Paper

Motionless and fast measurement technique for obtaining the spectral diffraction efficiencies of a grating

Shenghao Wang, Jianda Shao, Shijie Liu, Zhouling Wu, Jian Chen, Ming Huang

Proceedings Volume 11056, 110562G (2019) https://doi.org/10.1117/12.2524573

KEYWORDS: Diffraction gratings, Integrating spheres, Measurement devices

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Proceedings Article | 21 June 2019 Paper

Wavelength-switchable Fizeau interferometry and its applications

Shijie Liu, Qi Lu, You Zhou, Xueke Xu, Jianda Shao, Zhouling Wu, Jian Chen, Ming Huang

Proceedings Volume 11056, 1105627 (2019) https://doi.org/10.1117/12.2526377

KEYWORDS: Wavefronts, Interferometry, Interferometers, Aspheric lenses, Optical filters, Error analysis, Photovoltaics, Glasses, Optical components, Collimation

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Proceedings Article | 1 August 2017 Paper

Development of an infrared absorption measurement system for large aperture optics

Jian Chen, Jingtao Dong, Bingbing Li, Zhouling Wu

Proceedings Volume 10339, 103391A (2017) https://doi.org/10.1117/12.2275972

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Proceedings Article | 14 July 2015 Paper

Investigation on optical surface defect extraction algorithm based on background correction and image segmentation method

Bo Zhang, Fanyu Kong, Zhouling Wu, Shijie Liu

Proceedings Volume 9532, 95322D (2015) https://doi.org/10.1117/12.2186493

KEYWORDS: Image segmentation, Image processing algorithms and systems, Image processing, Optical components, Laser induced damage, Detection and tracking algorithms, Standards development, High power lasers, Algorithms, Image quality

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Proceedings Article | 4 May 2015 Paper

Photothermal microscopy: an effective diagnostic tool for laser irradiation effects on fused silica and KDP

Zhouling Wu, Jian Chen, Jingtao Dong

Proceedings Volume 9543, 95431V (2015) https://doi.org/10.1117/12.2182235

KEYWORDS: Absorption, Silica, Laser induced damage, Laser irradiation, Laser beam diagnostics, Laser processing, Microscopy, High power lasers, Photothermal effect, Diagnostics

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Proceedings Article | 4 May 2015 Paper

Evaluation of surface and bulk qualities of semiconductor materials by a laser-induced photothermal technique

Jingtao Dong, Jian Chen, Shiwen Sun, Dawei Zhang, Songlin Zhuang, Zhouling Wu

Proceedings Volume 9543, 95431B (2015) https://doi.org/10.1117/12.2182237

KEYWORDS: Crystals, Semiconductor materials, Absorption, Semiconducting wafers, Microscopy, Semiconductor lasers, Polishing, Refractive index, Silicon, Laser beam diagnostics

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Proceedings Article | 26 February 2015 Paper

In-situ investigation of damage processes on fused silica induced by a pulsed 355nm laser with high repetition rate

Jian Chen, Jingtao Dong, Zhouling Wu

Proceedings Volume 9345, 93450A (2015) https://doi.org/10.1117/12.2079085

KEYWORDS: Silica, Absorption, Laser induced damage, Laser processing, Laser irradiation, Pulsed laser operation, Laser beam diagnostics, Laser damage threshold, Laser scattering, Thermal effects

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Proceedings Article | 20 February 2015 Paper

Photothermal studies of the radiation effects on weakly absorptive optical thin film coatings induced by high repetitive laser pulses

Jingtao Dong, Jian Chen, Zhouling Wu, Huasong Liu, Yiqin Ji

Proceedings Volume 9346, 93460X (2015) https://doi.org/10.1117/12.2079099

KEYWORDS: Absorption, Thin film coatings, Laser beam diagnostics, Laser irradiation, Optical coatings, Continuous wave operation, Radiation effects, Laser processing, High power lasers, Modulation

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Proceedings Article | 31 October 2014 Paper

Photothermal microscopic studies of surface and subsurface defects on fused silica at 355nm

Jian Chen, Jingtao Dong, Qi Zhang, Zhouling Wu

Proceedings Volume 9237, 923706 (2014) https://doi.org/10.1117/12.2068119

KEYWORDS: Silica, Absorption, Laser induced damage, Microscopy, Laser beam diagnostics, Polishing, Microscopes, Surface finishing, 3D image processing, High power lasers

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Proceedings Article | 31 October 2014 Paper

Development of an automated absorption measurement instrument (a “turn-key” system) for optical thin film coatings

Jingtao Dong, Jian Chen, Zhouling Wu

Proceedings Volume 9237, 92371W (2014) https://doi.org/10.1117/12.2068121

KEYWORDS: Absorption, Thin film coatings, Absorbance, Laser beam diagnostics, Coating, Thermal effects, Laser applications, Sensors, Temperature metrology, Reflectivity

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Proceedings Article | 31 October 2014 Paper

Three dimensional mapping of absorption defects at 355 nm for potassium dihydrogen phosphate (KDP) used in high power laser systems

Jian Chen, Jingtao Dong, Qi Zhang, Zhouling Wu

Proceedings Volume 9237, 923716 (2014) https://doi.org/10.1117/12.2068120

KEYWORDS: Absorption, Crystals, Microscopes, High power lasers, 3D image processing, Laser beam diagnostics, Laser systems engineering, Microscopy, Potassium, Laser induced damage

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Proceedings Article | 5 September 2014 Paper

A sensitive optical probe for surface topography based on an optimized astigmatic method

Jingtao Dong, Gang Xiao, Jian Chen, Zhouling Wu

Proceedings Volume 9205, 920507 (2014) https://doi.org/10.1117/12.2062524

KEYWORDS: Reflectivity, Objectives, Head, Signal detection, Mirrors, Calibration, Microscopes, Glasses, Digital video discs, Ferroelectric materials

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Proceedings Article | 18 August 2014 Paper

Three-dimensional photothermal microscopy of KDP crystals

Jian Chen, Jingtao Dong, Qi Zhang, Zhouling Wu

Proceedings Volume 9203, 92030W (2014) https://doi.org/10.1117/12.2062528

KEYWORDS: Absorption, Crystals, Microscopes, Laser crystals, Laser beam diagnostics, Laser induced damage, High power lasers, 3D image processing, Microscopy, Laser damage threshold

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Proceedings Article | 9 July 2013 Paper

Study of photothermal response in thin film coatings by ellipsometry

Jingtao Dong, Jian Chen, Zhouling Wu

Proceedings Volume 8786, 87861A (2013) https://doi.org/10.1117/12.2020445

KEYWORDS: Laser beam diagnostics, Polarization, Refractive index, Absorption, Ellipsometry, Modulation, Thin film coatings, Statistical analysis, Polarizers, Beam splitters

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Proceedings Article | 9 July 2013 Paper

Design and development of an automated laser processing system for photovoltaic applications

Jian Chen, Zhouling Wu

Proceedings Volume 8786, 87860A (2013) https://doi.org/10.1117/12.2020442

KEYWORDS: Laser processing, Solar cells, Laser drilling, Doping, Laser ablation, Manufacturing, Silicon, Metals, Silicon solar cells, Photovoltaics

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Proceedings Article | 9 July 2013 Paper

Laser cutting of ultra-thin glasses based on a nonlinear laser interaction effect

Jian Chen, Zhouling Wu

Proceedings Volume 8786, 87860E (2013) https://doi.org/10.1117/12.2020467

KEYWORDS: Laser cutting, Glasses, Absorption, Pulsed laser operation, Laser processing, Laser glasses, Picosecond phenomena, Laser ablation, Electrons, Plasma

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Proceedings Article | 9 July 2013 Paper

Development of a "turn-key" system for weak absorption measurement and analysis

Jian Chen, Jingtao Dong, Zhouling Wu

Proceedings Volume 8786, 87861M (2013) https://doi.org/10.1117/12.2020455

KEYWORDS: Absorption, Laser beam diagnostics, High power lasers, Refractive index, Modulation, Laser irradiation, Thin film coatings, Photothermal effect, 3D image processing, Optical components

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Proceedings Article | 12 January 2012 Paper

Progress in advanced laser processing for manufacturing of high efficiency silicon solar cells

Jian Chen, Li Chen, Zhouling Wu, Junhong Yang, Yunfeng Ma

Proceedings Volume 8206, 82061E (2012) https://doi.org/10.1117/12.910470

KEYWORDS: Manufacturing, Silicon, Doping, Laser processing, Laser ablation, Silicon solar cells, Solar cells, Metals, Semiconductor lasers, Dielectrics

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Proceedings Article | 10 June 2004 Paper

Photothermal multi-pixel imaging microscope

Christopher Stolz, Diane Chinn, Robert Huber, Carolyn Weinzapfel, Zhouling Wu

Proceedings Volume 5273, (2004) https://doi.org/10.1117/12.523669

KEYWORDS: Microscopes, Coating, Microscopy, Data acquisition, Laser beam diagnostics, Absorption, Optical amplifiers, Sensors, Nondestructive evaluation, Optical coatings

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Proceedings Article | 12 April 2001 Paper

Laser conditioning characterization and damage threshold prediction of hafnia/silica multilayer mirrors by photothermal microscopy

A. Papandrew, Christopher Stolz, Zhouling Wu, Gary Loomis, Steven Falabella

Proceedings Volume 4347, (2001) https://doi.org/10.1117/12.425049

KEYWORDS: Coating, Laser damage threshold, Absorption, Microscopy, Silicon, Multilayers, Plasma, Silica, Mirrors, Laser induced damage

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Proceedings Article | 12 April 2001 Paper

Growth of laser-initiated damage in fused silica at 351 nm

Mary Norton, Lawrence Hrubesh, Zhouling Wu, Eugene Donohue, Michael Feit, Mark Kozlowski, David Milam, Kurt Neeb, William Molander, Alexander Rubenchik, Walter Sell, Paul Wegner

Proceedings Volume 4347, (2001) https://doi.org/10.1117/12.425055

KEYWORDS: Laser induced damage, Silica, UV optics, Ultraviolet radiation, Sol-gels, Antireflective coatings, Laser marking

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Proceedings Article | 12 April 2001 Paper

Absorptance measurements of optical coatings: a round robin

Robert Chow, John Taylor, Zhouling Wu, Albert Boccara, Ulrike Broulik, Y. Chen, Mireille Commandre, Jean DiJon, Christoph Fleig, Adolf Giesen, Zhengxiu Fan, Pao-Kuang Kuo, Ramin Lalezari, Kent Moncur, H.-J. Obramski, Catherine Pelle, David Reicher, Detlev Ristau, Pierre Roche, Bernhard Steiger, Marshall Thomsen, Marc Von Gunten, Qiang Zhao

Proceedings Volume 4347, (2001) https://doi.org/10.1117/12.425027

KEYWORDS: Silica, Absorption, Optical coatings, Reflectors, Mirrors, Calorimetry, Sputter deposition, Laser beam diagnostics, Metals, Optical testing

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SPIE Journal Paper | 1 December 1999

Pulsed photothermal deflection and diffraction effects: numerical modeling based on Fresnel diffraction theory

Yue Han, Zhouling Wu, Joseph Rosenshein, Marshall Thomsen, Qiang Zhao, Kent Moncur

OE, Vol. 38, Issue 12, (December 1999) https://doi.org/10.1117/12.10.1117/1.602321

KEYWORDS: Laser beam diagnostics, Diffraction, Sensors, Near field diffraction, Refractive index, Physics, Pulsed laser operation, Near field optics, Near field, Temperature metrology

Proceedings Article | 7 April 1999 Paper

Role of starting material composition in interfacial damage morphology of hafnia-silica multilayer coatings

S. Weakley, Christopher Stolz, Zhouling Wu, Ron Bevis, Marc Von Gunten

Proceedings Volume 3578, (1999) https://doi.org/10.1117/12.344420

KEYWORDS: Interfaces, Multilayers, Silica, Hafnium, Optical coatings, Plasma, Reflectors, Raster graphics, Oxides, Laser damage threshold

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Proceedings Article | 7 April 1999 Paper

Defect characterization on superpolished fused silica surfaces polished for high-power-laser applications at 355 nm (Abstract Only)

Lynn Sheehan, Zhouling Wu

Proceedings Volume 3578, (1999) https://doi.org/10.1117/12.344418

KEYWORDS: Silica, Polishing, Surface finishing, Laser induced damage, Microscopy, Laser damage threshold, Contamination, Absorption, Ultraviolet radiation, Optical microscopy

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Proceedings Article | 7 April 1999 Paper

Laser modulated scattering as a nondestructive evaluation tool for optical surfaces and thin film coatings

Zhouling Wu, Michael Feit, Mark Kozlowski, Alexander Rubenchik, Lynn Sheehan

Proceedings Volume 3578, (1999) https://doi.org/10.1117/12.344422

KEYWORDS: Laser scattering, Scattering, Laser beam diagnostics, Absorption, Modulation, Laser induced damage, Nondestructive evaluation, Signal detection, Optical coatings, Surface finishing

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Proceedings Article | 7 April 1999 Paper

Single-beam photothermal microscopy: a new diagnostic tool for optical materials

Zhouling Wu, Michael Feit, Mark Kozlowski, Jean-Yves Natoli, Alexander Rubenchik, Lynn Sheehan, Ming Yan

Proceedings Volume 3578, (1999) https://doi.org/10.1117/12.344423

KEYWORDS: Laser scattering, Scattering, Laser beam diagnostics, Laser induced damage, Signal detection, Microscopy, Modulation, Spatial resolution, Defect detection, Sensors

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Proceedings Article | 7 April 1999 Paper

Characterization of surface and subsurface defects in optical materials using near-field evanescent wave (Abstract Only)

Ming Yan, Stan Oberhelman, Wigbert Siekhaus, Zhouling Wu, Lynn Sheehan, Mark Kozlowski

Proceedings Volume 3578, (1999) https://doi.org/10.1117/12.344425

KEYWORDS: Near field scanning optical microscopy, Laser induced damage, Optical properties, Near field, Absorption, Optical coatings, Near field optics, Atomic force microscopy, Silica, Surface finishing

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Proceedings Article | 1 July 1998 Paper

Nonlinear absorption of photons in biological molecules: initial studies of melanin

Yue Han, Joseph Rosenshein, Zhouling Wu, Qiang Zhao, Tian Li Yang, Marshall Thomsen, Wen Ye

Proceedings Volume 3245, (1998) https://doi.org/10.1117/12.312320

KEYWORDS: Absorption, Photons, Molecules, Molecular biology, Laser beam diagnostics, Molecular lasers, Signal processing, Helium neon lasers, Ion lasers, Tissues

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