Zhu Ruan
at Univ of Science and Technology of China
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 29 May 2013 Paper
Z. Ruan, S. Mao, P. Zhang, H. Li, Z. Ding
Proceedings Volume 8729, 87290J (2013) https://doi.org/10.1117/12.2015357
KEYWORDS: Scanning electron microscopy, Monte Carlo methods, Fourier transforms, Monochromatic aberrations, Statistical modeling, Instrument modeling, Particles, Scattering, Device simulation, Image processing

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