Prof. Zonghua Zhang
Professor at Hebei Univ of Technology
SPIE Involvement:
Conference Program Committee | Author
Publications (43)

Proceedings Article | 18 December 2019 Paper
Proc. SPIE. 11338, AOPC 2019: Optical Sensing and Imaging Technology
KEYWORDS: Infrared cameras, Mirrors, Fringe analysis, Cameras, Calibration, Glasses, Deflectometry, 3D metrology, Projection systems, Infrared radiation

Proceedings Article | 18 November 2019 Paper
Proc. SPIE. 11189, Optical Metrology and Inspection for Industrial Applications VI
KEYWORDS: Mirrors, Fringe analysis, 3D acquisition, Reflection, Cameras, Calibration, Manufacturing, Deflectometry, LCDs, 3D metrology, Specular reflections, 3D imaging metrology

Proceedings Article | 13 May 2019 Presentation + Paper
Proc. SPIE. 10991, Dimensional Optical Metrology and Inspection for Practical Applications VIII
KEYWORDS: Mirrors, Fringe analysis, Imaging systems, Cameras, Calibration, CCD cameras, Deflectometry, LCDs, Distance measurement, 3D metrology, 3D imaging metrology

Proceedings Article | 2 November 2018 Paper
Proc. SPIE. 10819, Optical Metrology and Inspection for Industrial Applications V
KEYWORDS: Mirrors, Imaging systems, Cameras, Calibration, Error analysis, Computer vision technology, Mirror pointing, Neptunium

SPIE Journal Paper | 27 June 2018
OE Vol. 57 Issue 06
KEYWORDS: Fringe analysis, Principal component analysis, Distortion, Error analysis, Phase shifts, Calibration, Projection systems, 3D metrology, Complex systems, Optical engineering

Showing 5 of 43 publications
Conference Committee Involvement (8)
Dimensional Optical Metrology and Inspection for Practical Applications X
11 April 2021 | Orlando, Florida, United States
Optical Metrology and Inspection for Industrial Applications VII
12 October 2020 | Online Only, China
Dimensional Optical Metrology and Inspection for Practical Applications IX
27 April 2020 | Online Only, California, United States
Optical Metrology and Inspection for Industrial Applications VI
21 October 2019 | Hangzhou, China
Dimensional Optical Metrology and Inspection for Practical Applications VIII
16 April 2019 | Baltimore, Maryland, United States
Showing 5 of 8 Conference Committees
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