Dr. Zu-Han Gu
Retired
SPIE Involvement:
Author
Publications (48)

Proceedings Article | 2 September 2010 Paper
Proc. SPIE. 7792, Reflection, Scattering, and Diffraction from Surfaces II
KEYWORDS: Light sources, Scattering, Interferometers, Glasses, Argon ion lasers, Laser scattering, Wavefronts, Free space, Light, Michelson interferometers

Proceedings Article | 2 September 2010 Paper
Proc. SPIE. 7792, Reflection, Scattering, and Diffraction from Surfaces II
KEYWORDS: Scattering, Laser applications, Laser scattering, Astronomical imaging, Atmospheric propagation, Laser optics, Beam propagation method, Electromagnetism, Electromagnetic scattering, Radio propagation

Proceedings Article | 2 September 2010 Paper
Proc. SPIE. 7792, Reflection, Scattering, and Diffraction from Surfaces II
KEYWORDS: Metamaterials, Diffraction, Scattering, Glasses, Dielectrics, Interfaces, Light scattering, Optical testing, Refraction, 3D metrology

Proceedings Article | 21 August 2009 Paper
Proc. SPIE. 7405, Instrumentation, Metrology, and Standards for Nanomanufacturing III
KEYWORDS: Metamaterials, Surface plasmons, Scattering, Glasses, Dielectrics, Interfaces, Light scattering, Photoresist materials, Refraction, Negative refraction

Proceedings Article | 29 August 2008 Paper
Proc. SPIE. 7065, Reflection, Scattering, and Diffraction from Surfaces
KEYWORDS: Mirrors, Speckle, Metals, Glasses, Dielectrics, Interfaces, Collimation, Feedback loops, Geometrical optics, Visibility

Showing 5 of 48 publications
Proceedings Volume Editor (13)

Showing 5 of 13 publications
Conference Committee Involvement (13)
Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors V
24 August 2011 | San Diego, California, United States
Reflection, Scattering, and Diffraction from Surfaces II
2 August 2010 | San Diego, California, United States
Reflection, Scattering, and Diffraction from Surfaces
11 August 2008 | San Diego, California, United States
Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies III
28 August 2007 | San Diego, California, United States
Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II
2 August 2005 | San Diego, California, United States
Showing 5 of 13 Conference Committees
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