Fook Kong Chong
Test System Electronics Engineer at e2v technologies plc
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Publications (1)

Proceedings Article | 13 July 2004 Paper
F. Chong, Colin Coates, Donal Denvir, Noel McHale, Keith Thornbury, Mark Hollywood
Proceedings Volume 5324, (2004) https://doi.org/10.1117/12.529220
KEYWORDS: Charge-coupled devices, Confocal microscopy, Electron multiplying charge coupled devices, Cameras, Microscopy, Image segmentation, Sensors, CCD cameras, Calcium, Luminescence

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