Mr. Huijie Zhu Profile

Huijie Zhu

at Shanghai Univ

SPIE Involvement:

Author

Publications (1)

This will count as one of your downloads.

You will have access to both the presentation and article (if available).

DOWNLOAD NOW

This content is available for download via your institution's subscription. To access this item, please sign in to your personal account.

Email or Username Forgot your username?

Password Forgot your password?

Show

Keep me signed in

No SPIE account? Create an account

Proceedings Article | 27 January 2023 Paper

From fringe phases or from pixel shifts: a comparative study of depth-measuring modes in fringe projection profilometry

Huijie Zhu, Hongwei Guo

Proceedings Volume 12550, 125500J (2023) https://doi.org/10.1117/12.2666650

KEYWORDS: Projection systems, Cameras, Calibration, Phase measurement, Imaging systems, Phase shifts, Fringe analysis, Distortion, Incident light

Read Abstract +

In fringe projection profilometry, by taking the projector as a camera, depth measurement has the similar principle with binocular vision. The matching of feature points carrying depth information plays an important role in measurement. Due to the existence of difficultly-corrected projector errors, the measurement results of using a fixed point in camera corresponding to the points in the projector or of conversely using a fixed point in projector corresponding to the points in the camera is not exactly same. According to fringe projection system, a function representing the relationship between the depths and the corresponding fringe phases is introduced for measurement. This traditional method usually requires three or more known reference planes to calibrate parameters determined by the measurement system. However, another way is also feasible. Based on the measurement system, a generic function representing the relationship between the depths and the corresponding pixel shifts are also presented in this paper. Using these two functions allows us to recover the depth information of the object. Theoretical analyses are carried out to investigate the performances of these two methods. Comparative experiments are implemented, and their results demonstrate that the depth measurement method from pixel shifts is immune to the influence of high order harmonics as a little expense of efficiency, being better than the method from fringe phases having high measurement efficiency regardless of the low accuracy.

My Library

You currently do not have any folders to save your paper to! Create a new folder below.

Folder Name

Folder Description

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks. You are receiving this notice because your organization may not have SPIE eBooks access.*

*Shibboleth/Open Athens users─please sign in to access your institution's subscriptions.

To obtain this item, you may purchase the complete book in print or electronic format on SPIE.org.

ORGANIZATIONAL
Sign in with credentials provided by your organization.

Organizational Username

Organizational Password

Show/Hide Password

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members:

Non-members: ADD TO CART

Keywords/Phrases

Search In:

Publication Years