Prof. Jeremy Coupland
at Loughborough Univ
SPIE Involvement:
Author
Publications (26)

Proceedings Article | 1 April 2020 Paper
Proc. SPIE. 11352, Optics and Photonics for Advanced Dimensional Metrology
KEYWORDS: Confocal microscopy, Microscopes, Scattering, Interferometry, 3D modeling, Optical testing, Multiple scattering, 3D metrology, Profilometers, Convolution

SPIE Journal Paper | 25 March 2020
OE Vol. 59 Issue 03
KEYWORDS: 3D modeling, Instrument modeling, Microscopy, Scattering, Optical engineering, Spatial frequencies, Objectives, Multiple scattering, Data modeling, Polarization

Proceedings Article | 3 September 2019 Presentation + Paper
Proc. SPIE. 11102, Applied Optical Metrology III
KEYWORDS: Spatial frequencies, Microscopy, Manufacturing, 3D modeling, 3D metrology

Proceedings Article | 21 June 2019 Presentation + Paper
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI
KEYWORDS: Photodetectors, Holograms, Digital holography, Imaging systems, Sensors, Interferometry, Spatial resolution, Prototyping

Proceedings Article | 21 June 2019 Presentation + Paper
Proc. SPIE. 11057, Modeling Aspects in Optical Metrology VII
KEYWORDS: Modeling, Spatial frequencies, Scattering, Interferometry, 3D modeling, Multiple scattering, Phase measurement, Systems modeling, Instrument modeling

Showing 5 of 26 publications
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