Jia Tang
at Zhejang Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 20 November 2012 Paper
Proc. SPIE. 8563, Optical Metrology and Inspection for Industrial Applications II
KEYWORDS: CMOS sensors, Imaging systems, Cameras, Sensors, Calibration, Data processing, Distance measurement, Machine vision, Stereo vision systems, 3D vision

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