Prof. Junbiao Liu Profile

Prof. Junbiao Liu

at Institute of Electrical Engineering,CAS

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Publications (7)

Proceedings Article | 10 September 2022 Paper

Research on constant area spectral peak reconstruction algorithm for improving energy resolution of silicon drift detectors

Longjun Cheng, Bohua Yin, Mingzhang Chu, Zhengjie Li, Botong Sun, Dazheng Wang, Junbiao Liu, Li Han

Proceedings Volume 12328, 123280Q (2022) https://doi.org/10.1117/12.2644190

KEYWORDS: X-rays, Silicon, Reconstruction algorithms, Sensors, Spectral resolution, Quantization, Mathematical modeling, Manganese, Zirconium, Scanning electron microscopy

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Proceedings Article | 6 February 2019 Paper

A true-color nano-CT based on SEM

Weixia Zhao, Junbiao Liu, Geng Niu, Yutian Ma, Yan Wang, Li Han

Proceedings Volume 10842, 108420P (2019) https://doi.org/10.1117/12.2504965

KEYWORDS: X-rays, X-ray computed tomography, X-ray imaging, Image segmentation, Scanning electron microscopy, CT reconstruction, Computed tomography, Principal component analysis, Chromium

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Proceedings Article | 24 January 2019 Paper

Design and fabrication of a new tungsten-diamond transmission target for micro-computed tomography

Geng Niu, Junbiao Liu, Yutian Ma, Han Li, Weixia Zhao

Proceedings Volume 10840, 108400X (2019) https://doi.org/10.1117/12.2506351

KEYWORDS: X-rays, Electron beams, Monte Carlo methods, Sputter deposition

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Proceedings Article | 24 January 2019 Paper

Study of the linewidth measurement with scanning electron microscope based on laser interference principle

Bohua Yin, Mingzhang Chu, Guanglu Xu, Xue Li, Junbiao Liu, Daixie Chen, Han Li, Chao Jiang, Xiaoyong Cai

Proceedings Volume 10840, 108400U (2019) https://doi.org/10.1117/12.2505766

KEYWORDS: Scanning electron microscopy, Metrology, Digital signal processing, Interferometers, Electron microscopes, Image processing, Semiconductors, Image resolution, Raster graphics, Calibration

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Proceedings Article | 25 October 2016 Paper

Research on the electron beam spot detection methods based on SEM

Weixia Zhao, Junbiao Liu, Geng Niu, Yutian Ma, Li Han

Proceedings Volume 9687, 96870C (2016) https://doi.org/10.1117/12.2245029

KEYWORDS: Electron beams, Scanning electron microscopy, X-ray sources, Edge detection, Reticles, Calibration, Semiconducting wafers, Signal detection, Silicon, Metals

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Proceedings Article | 25 October 2016 Paper

Researches on stability of microfocus electron-impact x-ray source

Yu-tian Ma, Jun-Biao Liu, Wei-xia Zhao, Geng Niu, Li Han

Proceedings Volume 9685, 96850J (2016) https://doi.org/10.1117/12.2243125

KEYWORDS: X-ray sources, X-rays, Electron beams, Magnetism, Spatial resolution, Tungsten, Lenses, X-ray imaging, Electrodes, Sensors

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Proceedings Article | 25 October 2016 Paper

X-ray microscopy using reflection targets based on SEM with tungsten filament

Junbiao Liu, Yutian Ma, Weixia Zhao, Geng Niu, Mingzhang Chu, Bohua Yin, Li Han, Baodong Liu

Proceedings Volume 9685, 96850I (2016) https://doi.org/10.1117/12.2241728

KEYWORDS: X-ray microscopy, Scanning electron microscopy, Tungsten, X-ray imaging, X-rays, Electron beams, Sensors, X-ray detectors, Signal attenuation, Beryllium

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Showing 5 of 7 publications

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