Rachel Tianyuan Ding
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 13 March 2024 Presentation + Paper
Proceedings Volume 12900, 1290007 (2024) https://doi.org/10.1117/12.3005047
KEYWORDS: Depth of field, Focus stacking, Imaging systems, 3D image processing, 3D metrology, 3D image reconstruction

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