Mr. Shang-Wei Lin Profile

Shang-Wei Lin

at National Synchrotron Radiation Research Ctr

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Author

Publications (9)

Proceedings Article | 3 October 2023 Presentation + Paper

Developing bendable air bearing slide supporting long trace profiler to compensate gravity effect during measuring process

Shang-Wei Lin, Chao-Chih Chiu, Chih-Yu Hua, Hok-Sum Fung, Ming-Ying Hsu, Huang-Wen Fu, Chia-Feng Chang, Gung-Chian Yin

Proceedings Volume 12695, 1269506 (2023) https://doi.org/10.1117/12.2681814

KEYWORDS: Mirrors, Mirror surfaces, Actuators, Optical components, Optical surfaces, Synchrotron radiation, Autocollimators

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Proceedings Article | 28 September 2023 Presentation + Paper

The UHV chamber window glass mounting design and analysis

Ming-Ying Hsu, Hok-Sum Fung, Shang-Wei Lin, Gung-Chian Yin

Proceedings Volume 12669, 1266909 (2023) https://doi.org/10.1117/12.2672854

KEYWORDS: Design and modelling, Windows, Glasses, Deformation, Vacuum chambers, Mirrors, Mirror surfaces, Tin, Carbon, X-rays

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Proceedings Article | 21 August 2020 Presentation

In-situ metrology for adaptive x-ray optics with an in-position LTP system in the soft x-ray beamline

Shang-Wei Lin, Duan-Jen Wang, Chih-Yu Hua, Hok-Sum Fung, Ming-Ying Hsu, Gung-Chian Yin

Proceedings Volume 11492, 114920G (2020) https://doi.org/10.1117/12.2570538

KEYWORDS: X-rays, Metrology, X-ray optics, Optical design, Mirrors, Glasses, Optical components, Reflection, Switches, Optical mounts

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Proceedings Article | 21 August 2020 Presentation

The pivot bearing rotation mechanism test for stitching interferometer measurement

Ming-Ying Hsu, Gung-Chian Yin, Bo-Yi Chen, Chien-yu Lee, Shang-Wei Lin, Hok-Sum Fung, Yu-Shan Huang

Proceedings Volume 11492, 114920B (2020) https://doi.org/10.1117/12.2567561

KEYWORDS: Interferometers, Mirrors, X-rays

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Proceedings Article | 11 September 2019 Presentation + Paper

The in-situ long trace profiler window glass thermal deformation effect of measurement analysis

Ming-Ying Hsu, Gung-Chian Yin, Chien-yu Lee, Bo-Yi Chen, Hok-Sum Fung, Shang-Wei Lin, Duan-Jen Wang, Yu-Shan Huang

Proceedings Volume 11103, 111030D (2019) https://doi.org/10.1117/12.2529051

KEYWORDS: Glasses, Thermal effects, Finite element methods, Mirrors, Geometrical optics, In situ metrology, X-rays

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Proceedings Article | 9 September 2019 Presentation

Slope error correction of bendable gratings with an in-situ long trace profiler for the soft x-ray beamline at National Synchrotron Radiation Research Center (NSRRC) (Conference Presentation)

Shang-Wei Lin, Duan-Jen Wang, Chih-Yu Hua, Hok-Sum Fung, Ming-Ying Hsu, Gung-Chian Yin

Proceedings Volume 11109, 111090D (2019) https://doi.org/10.1117/12.2528382

KEYWORDS: X-rays, Synchrotron radiation, Thermography, Optical design, Actuators, In situ metrology, Mirrors, Disk lasers, Laser scattering, Scattering

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Proceedings Article | 9 September 2019 Presentation + Paper

The in-situ LTP window glass optomechanical analysis

Ming-Ying Hsu, Gung-Chian Yin, Chien-yu Lee, Bo-Yi Chen, Hok-Sum Fung, Shang-Wei Lin, Duan-Jen Wang, Yu-Shan Huang

Proceedings Volume 11109, 111090Q (2019) https://doi.org/10.1117/12.2525560

KEYWORDS: Glasses, Mirrors, Ray tracing, Finite element methods, Zernike polynomials, Calibration, In situ metrology, Geometrical optics, Dysprosium

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Proceedings Article | 30 August 2019 Presentation + Paper

High loading precision rotation stage design for synchrotron radiation mirror stitching measurement

Ming-Ying Hsu, Gung-Chian Yin, Chien-yu Lee, Bo-Yi Chen, Hok-Sum Fung, Shang-Wei Lin, Duan-Jen Wang, Yu-Shan Huang

Proceedings Volume 11100, 111000H (2019) https://doi.org/10.1117/12.2525563

KEYWORDS: Mirrors, Interferometers, Synchrotron radiation, Manufacturing, Actuators, Optical testing, X-ray optics, X-rays, Ferroelectric materials, Finite element methods

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Proceedings Article | 25 October 2016 Paper

Progress in upgrading a long trace profiler at NSRRC

Duan-Jen Wang, Shang-Wei Lin, Shen-Yaw Perng

Proceedings Volume 9687, 96870F (2016) https://doi.org/10.1117/12.2247664

KEYWORDS: Mirrors, Head, Optical testing, Calibration, Charge-coupled devices, Temperature metrology, Turbulence, Inspection, Environmental sensing, Metrology

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Showing 5 of 9 publications

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