Shang-Wei Lin
at National Synchrotron Radiation Research Ctr
SPIE Involvement:
Author
Publications (7)

Proceedings Article | 21 August 2020 Presentation
Proc. SPIE. 11492, Advances in Metrology for X-Ray and EUV Optics IX
KEYWORDS: Optical components, Mirrors, Optical design, X-ray optics, Metrology, Switches, Reflection, Glasses, X-rays, Optical mounts

Proceedings Article | 21 August 2020 Presentation
Proc. SPIE. 11492, Advances in Metrology for X-Ray and EUV Optics IX
KEYWORDS: Mirrors, Interferometers, X-rays

Proceedings Article | 11 September 2019 Presentation + Paper
Proc. SPIE. 11103, Optical Modeling and System Alignment
KEYWORDS: Mirrors, Glasses, In situ metrology, X-rays, Thermal effects, Finite element methods, Geometrical optics

Proceedings Article | 9 September 2019 Presentation
Proc. SPIE. 11109, Advances in Metrology for X-Ray and EUV Optics VIII
KEYWORDS: Actuators, Thermography, Mirrors, Optical design, Scattering, In situ metrology, X-rays, Laser scattering, Synchrotron radiation, Disk lasers

Proceedings Article | 9 September 2019 Presentation + Paper
Proc. SPIE. 11109, Advances in Metrology for X-Ray and EUV Optics VIII
KEYWORDS: Mirrors, Calibration, Glasses, In situ metrology, Zernike polynomials, Ray tracing, Finite element methods, Dysprosium, Geometrical optics

Showing 5 of 7 publications
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