Dr. Tomohiro Nishitani
at Photo electron Soul Inc.
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 10 April 2024 Poster + Paper
Proceedings Volume 12955, 1295533 (2024) https://doi.org/10.1117/12.3010730
KEYWORDS: Electron beams, Semiconductors, Scanning electron microscopy, Transmission electron microscopy, Laser irradiation, Semiconductor materials, Group III-V semiconductors, Electron microscopes, Vacuum

Proceedings Article | 27 April 2023 Poster + Paper
Proceedings Volume 12496, 1249629 (2023) https://doi.org/10.1117/12.2657032
KEYWORDS: Electron beams, Quantum efficiency, Scanning electron microscopy, Indium gallium nitride, Semiconductors

Proceedings Article | 27 April 2023 Poster + Paper
Proceedings Volume 12496, 124962N (2023) https://doi.org/10.1117/12.2657853
KEYWORDS: Scanning electron microscopy, Electron beams, Semiconductors, Electrodes, Laser irradiation, Imaging systems, Modulation, Control systems, Beam controllers, Semiconductor lasers

Proceedings Article | 13 March 2015 Paper
T. Nishitani, T. Maekawa, M. Tabuchi, T. Meguro, Y. Honda, H. Amano
Proceedings Volume 9363, 93630T (2015) https://doi.org/10.1117/12.2076681
KEYWORDS: Indium gallium nitride, Gallium arsenide, Quantum efficiency, Gallium nitride, P-type semiconductors, Semiconductors, Cesium, Electron beams, Adsorption, Protactinium

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