Mr. Renwei Zhang Profile

Renwei Zhang

at Dalian Univ of Technology

SPIE Involvement:

Author

Publications (1)

This will count as one of your downloads.

You will have access to both the presentation and article (if available).

DOWNLOAD NOW

This content is available for download via your institution's subscription. To access this item, please sign in to your personal account.

Email or Username Forgot your username?

Password Forgot your password?

Show

Keep me signed in

No SPIE account? Create an account

Proceedings Article | 5 March 2018 Paper

Local high precision 3D measurement based on line laser measuring instrument

Renwei Zhang, Wei Liu, Yongkang Lu, Yang Zhang, Jianwei Ma, Zhenyuan Jia

Proceedings Volume 10710, 107101L (2018) https://doi.org/10.1117/12.2317530

KEYWORDS: Laser scanners

Read Abstract +

In order to realize the precision machining and assembly of the parts, the geometrical dimensions of the surface of the local assembly surfaces need to be strictly guaranteed. In this paper, a local high-precision three-dimensional measurement method based on line laser measuring instrument is proposed to achieve a high degree of accuracy of the three-dimensional reconstruction of the surface. Aiming at the problem of two-dimensional line laser measuring instrument which lacks one-dimensional high-precision information, a local three-dimensional profile measuring system based on an accurate single-axis controller is proposed. First of all, a three-dimensional data compensation method based on spatial multi-angle line laser measuring instrument is proposed to achieve the high-precision measurement of the default axis. Through the pretreatment of the 3D point cloud information, the measurement points can be restored accurately. Finally, the target spherical surface is needed to make local three-dimensional scanning measurements for accuracy verification. The experimental results show that this scheme can get the local three-dimensional information of the target quickly and accurately, and achieves the purpose of gaining the information and compensating the error for laser scanner information, and improves the local measurement accuracy.

My Library

You currently do not have any folders to save your paper to! Create a new folder below.

Folder Name

Folder Description

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks. You are receiving this notice because your organization may not have SPIE eBooks access.*

*Shibboleth/Open Athens users─please sign in to access your institution's subscriptions.

To obtain this item, you may purchase the complete book in print or electronic format on SPIE.org.

ORGANIZATIONAL
Sign in with credentials provided by your organization.

Organizational Username

Organizational Password

Show/Hide Password

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members:

Non-members: ADD TO CART

Keywords/Phrases

Search In:

Publication Years