Paper
6 July 1979 Determination Of High-Intensity X-Ray Spectra
James A. Mulvaney, Raymond P. Rossi
Author Affiliations +
Proceedings Volume 0173, Application of Optical Instrumentation in Medicine VII; (1979) https://doi.org/10.1117/12.957116
Event: Application of Optical Instrumentation in Medicine VII, 1979, Toronto, Canada
Abstract
A method for determining high intensity x-ray spectra from diagnostic x-ray units is described. The method combines direct measurements of low intensity, constant potential x-ray spectra with digitized measurements of current and voltage waveforms at high intensity to determine high intensity x-ray spectra. The effect of ripple in the voltage waveform on the resulting x-ray spectra is also shown.
© (1979) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
James A. Mulvaney and Raymond P. Rossi "Determination Of High-Intensity X-Ray Spectra", Proc. SPIE 0173, Application of Optical Instrumentation in Medicine VII, (6 July 1979); https://doi.org/10.1117/12.957116
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KEYWORDS
X-rays

Medicine

Optical instrument design

Diagnostics

Sensors

Aluminum

Oscilloscopes

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