Application Of Laser Interferometry For The Determination Of Optical Path Changes Of Reflecting Optical Systems

Jiri Krsek

doi:10.1117/12.942405

18 January 1985 Application Of Laser Interferometry For The Determination Of Optical Path Changes Of Reflecting Optical Systems

Jiri Krsek

Author Affiliations +

Proceedings Volume 0473, Symposium Optika '84; (1985) https://doi.org/10.1117/12.942405
Event: Symposium Optika '84, 1984, Budapest, Hungary

Abstract

Increased demands on geometrical accuracy and adjustment of optical elements and systems used in the laser measuring technique brought about development of new interference testing methods. The interference principle of determining optical path changes of the reflecting optical system enables the direct determination of changes of the functional arrangement of the measured optical system. The described interference methods are used for testing straightness and orthogonality of the coordinate axes of the reflecting optical system for a two-coordinate interferometer.

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Jiri Krsek "Application Of Laser Interferometry For The Determination Of Optical Path Changes Of Reflecting Optical Systems", Proc. SPIE 0473, Symposium Optika '84, (18 January 1985); https://doi.org/10.1117/12.942405

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