Layered Synthetic Microstructures for Long Wavelength X-Ray Spectrometry

J. A. Nicolosi; R. Jenkins; J. P. Groven; D. Merlo

doi:10.1117/12.949690

6 May 1985 Layered Synthetic Microstructures for Long Wavelength X-Ray Spectrometry

J. A. Nicolosi, R. Jenkins, J. P. Groven, D. Merlo

Proceedings Volume 0563, Applications of Thin Film Multilayered Structures to Figured X-Ray Optics; (1985) https://doi.org/10.1117/12.949690
Event: 29th Annual Technical Symposium, 1985, San Diego, United States

Abstract

We have recently, briefly described the properties of several types of Layered Synthetic Microstructures, (LSM) and their use in the measurement of elements traditionally covered by the acid Phthalate and Langmuir - Blodgett diffracting structures.1 In this application, the wavelength range is extended to cover oxygen, nitrogen, carbon and boron. One of the major problems in working in the longer wavelength region is that the large incremental difference in wavelength per atomic number step makes it difficult to achieve a good comprise between the wavelength range coverable with a given d-spacing and the angular dispersion achievable. It is possible to optimize these structures to provide excellent diffraction and dispersion properties over most of the long wavelength characteristic x-ray emission region. By developing structures which suppress higher order spectra and by clever selection of substrate composition, both performance and range of application are extended beyond initial expectations. This paper describes some of the work that has been done to provide such optimization and then discusses results obtained with typical LSM's.

Citation Download Citation

J. A. Nicolosi, R. Jenkins, J. P. Groven, and D. Merlo "Layered Synthetic Microstructures for Long Wavelength X-Ray Spectrometry", Proc. SPIE 0563, Applications of Thin Film Multilayered Structures to Figured X-Ray Optics, (6 May 1985); https://doi.org/10.1117/12.949690

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