Paper
16 July 1986 Application Of Great Depth Holographic Technique To Double-Exposure Holographic Interferometry
Xiong Binghen, Gou Wanfu
Author Affiliations +
Proceedings Volume 0599, Optics in Engineering Measurement; (1986) https://doi.org/10.1117/12.952362
Event: 1985 International Technical Symposium/Europe, 1985, Cannes, France
Abstract
Development of the technique of great depth holography applied to the engineering measurement is introduced in this paper. In double-exposure holographic interferometry the object is illuminated by multi-beam of object waves with various path difference of even multiple of cavity length. This method is useful for the holographic interferometry applied to large engineering structure.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xiong Binghen and Gou Wanfu "Application Of Great Depth Holographic Technique To Double-Exposure Holographic Interferometry", Proc. SPIE 0599, Optics in Engineering Measurement, (16 July 1986); https://doi.org/10.1117/12.952362
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KEYWORDS
Holographic interferometry

Holography

Wave plates

Holograms

Structural engineering

Coherence (optics)

Data modeling

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