Paper
10 September 1987 Speckle Imaging : Description Of The Second Probability Density Function Of A Binary Star Speckle Pattern
Claude Aime
Author Affiliations +
Proceedings Volume 0808, Inverse Problems in Optics; (1987) https://doi.org/10.1117/12.941456
Event: Fourth International Symposium on Optical and Optoelectronic Applied Sciences and Engineering, 1987, The Hague, Netherlands
Abstract
It is shown that the second probability density function of a stellar speckle pattern observed at the focus of a large telescope can be used for imaging double stars. For a given binary system, the number of detected photons required to establish the relative positions of the components is derived. It is shown that probability imaging can be performed in a reasonable observing time for average photon counting levels as low as 0.01 event per pixel. At such low light levels, the most significant indicator of the relative positions of the bright and weaker components is given by the simultaneous detection of a single photon event and a double photon event, with the events being spatially separated by a vector corresponding to the separation of the two stars. Under these conditions, this result has repercussions on the design requirements of a two-dimensional photon-counting detector used for probability imaging applications.
© (1987) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Claude Aime "Speckle Imaging : Description Of The Second Probability Density Function Of A Binary Star Speckle Pattern", Proc. SPIE 0808, Inverse Problems in Optics, (10 September 1987); https://doi.org/10.1117/12.941456
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Cited by 2 scholarly publications.
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KEYWORDS
Stars

Photons

Speckle pattern

Sensors

Photodetectors

Inverse optics

Inverse problems

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