A high-speed and low-noise intelligent test system for infrared detectors

Tianshi Jia; Yulong Xue; Kun Cui; Fansheng Kong

doi:10.1117/12.2246425

3 November 2016 A high-speed and low-noise intelligent test system for infrared detectors

Tianshi Jia, Yulong Xue, Kun Cui, Fansheng Kong

Proceedings Volume 10030, Infrared, Millimeter-Wave, and Terahertz Technologies IV; 100301E (2016) https://doi.org/10.1117/12.2246425
Event: SPIE/COS Photonics Asia, 2016, Beijing, China

Abstract

With the development of infrared focal plane technology, the scale of the detector becomes larger and larger, and the pixel noise level is lower and lower. We designed and implemented a set of infrared high-speed low noise intelligent test system based on OPENVPX standard, which is used to test the index, long term monitoring and life test of infrared detector. The system is mainly composed of main control board, image acquisition board, temperature acquisition board and the high speed back board, which has high speed image acquisition, processing, temperature monitoring and alarm function. Through testing and simulation, the results show that the system noise is less than 100uV, the dynamic range reaches 100dB, and the data throughput rate reaches 4Gbps, which can meet the requirements of the infrared detector test currently.

Citation Download Citation

Tianshi Jia, Yulong Xue, Kun Cui, and Fansheng Kong "A high-speed and low-noise intelligent test system for infrared detectors", Proc. SPIE 10030, Infrared, Millimeter-Wave, and Terahertz Technologies IV, 100301E (3 November 2016); https://doi.org/10.1117/12.2246425

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