CONFERENCE PROCEEDINGS
Advanced Search
Home > Proceedings > Volume 10250 > Article
Paper
10 February 2017 A positional misalignment correction method for Fourier ptychographic microscopy based on simulated annealing
Jiasong Sun, Yuzhen Zhang, Qian Chen, Chao Zuo
Author Affiliations +
Proceedings Volume 10250, International Conference on Optical and Photonics Engineering (icOPEN 2016); 102501I (2017) https://doi.org/10.1117/12.2266662
Event: Fourth International Conference on Optical and Photonics Engineering, 2016, Chengdu, China
Abstract
Fourier ptychographic microscopy (FPM) is a newly developed super-resolution technique, which employs angularly varying illuminations and a phase retrieval algorithm to surpass the diffraction limit of a low numerical aperture (NA) objective lens. In current FPM imaging platforms, accurate knowledge of LED matrix’s position is critical to achieve good recovery quality. Furthermore, considering such a wide field-of-view (FOV) in FPM, different regions in the FOV have different sensitivity of LED positional misalignment. In this work, we introduce an iterative method to correct position errors based on the simulated annealing (SA) algorithm. To improve the efficiency of this correcting process, large number of iterations for several images with low illumination NAs are firstly implemented to estimate the initial values of the global positional misalignment model through non-linear regression. Simulation and experimental results are presented to evaluate the performance of the proposed method and it is demonstrated that this method can both improve the quality of the recovered object image and relax the LED elements’ position accuracy requirement while aligning the FPM imaging platforms.
© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Citation Download Citation
Jiasong Sun, Yuzhen Zhang, Qian Chen, and Chao Zuo "A positional misalignment correction method for Fourier ptychographic microscopy based on simulated annealing", Proc. SPIE 10250, International Conference on Optical and Photonics Engineering (icOPEN 2016), 102501I (10 February 2017); https://doi.org/10.1117/12.2266662
ACCESS THE FULL ARTICLE
ORGANIZATIONAL
Sign in with credentials provided by your organization.
INSTITUTIONAL
Select your institution to access the SPIE Digital Library.
SELECT YOUR INSTITUTION
PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
PERSONAL SIGN IN
No SPIE Account? Create one
PURCHASE THIS CONTENT
SUBSCRIBE TO DIGITAL LIBRARY
50 downloads per 1-year subscription
Members: $195
Non-members: $335 ADD TO CART
25 downloads per 1 - year subscription
Members: $145
Non-members: $250 ADD TO CART
PURCHASE SINGLE ARTICLE
Includes PDF, HTML & Video, when available
Members: $17.00
Non-members: $21.00 ADD TO CART
PROCEEDINGS
 5 PAGES
DOWNLOAD PAPER SAVE TO MY LIBRARY
GET CITATION
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Microscopy
Algorithms
Computational imaging
Image restoration
Phase retrieval
RELATED CONTENT
Subscribe to Digital Library
Receive Erratum Email Alert
Back to Top