Absolute Measurements Of Diffuse Reflectance In The 0.8-5.5 µm Region

D. Sheffer

doi:10.1117/12.951087

5 July 1989 Absolute Measurements Of Diffuse Reflectance In The 0.8-5.5 µm Region

D. Sheffer

Proceedings Volume 1038, 6th Mtg in Israel on Optical Engineering; (1989) https://doi.org/10.1117/12.951087
Event: Sixth Meeting of Optical Engineering in Israel, 1988, Tel Aviv, Israel

Abstract

An absolute reflectometer for the 0.8-5.5μm region is described. It is based on integrating spheres, and utilizes the Third Taylor method in the 7°/d configuration. A new theory for the reduction of the data is presented, and results for some diffuse gold samples are given.

Citation Download Citation

D. Sheffer "Absolute Measurements Of Diffuse Reflectance In The 0.8-5.5 µm Region", Proc. SPIE 1038, 6th Mtg in Israel on Optical Engineering, (5 July 1989); https://doi.org/10.1117/12.951087

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