Scanning Single-Slit And Double-Slit Phase Measurements Of Grating Surface Emitter Diode Laser Arrays

Stanley L. Reinhold; J. Michael Finlan; John G. Lehman; Scott M. Hamilton

doi:10.1117/12.976363

22 June 1989 Scanning Single-Slit And Double-Slit Phase Measurements Of Grating Surface Emitter Diode Laser Arrays

Stanley L. Reinhold, J. Michael Finlan, John G. Lehman, Scott M. Hamilton

Proceedings Volume 1043, Laser Diode Technology and Applications; (1989) https://doi.org/10.1117/12.976363
Event: OE/LASE '89, 1989, Los Angeles, CA, United States

Abstract

We report measurements of the near-field phase of a two-dimensional array of grating surface emitter diode lasers. The measurements were performed by scanning single and double slits. We use the individually measured phases over 300 μm x 50 μm emitting regions to predict the beam quality, and we compare the predictions with measured data.

Citation Download Citation

Stanley L. Reinhold, J. Michael Finlan, John G. Lehman, and Scott M. Hamilton "Scanning Single-Slit And Double-Slit Phase Measurements Of Grating Surface Emitter Diode Laser Arrays", Proc. SPIE 1043, Laser Diode Technology and Applications, (22 June 1989); https://doi.org/10.1117/12.976363

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available