Paper
6 October 2017 Speed scanning system based on solid-state microchip laser for architectural planning
Dmitriy Redka, Alexsandr S. Grishkanich, Egor Kolmakov, Konstantin Tsvetkov
Author Affiliations +
Abstract
According to the current great interest concerning Large-Scale Metrology applications in many different fields of manufacturing industry, technologies and techniques for dimensional measurement have recently shown a substantial improvement. Ease-of-use, logistic and economic issues, as well as metrological performance, are assuming a more and more important role among system requirements. The project is planned to conduct experimental studies aimed at identifying the impact of the application of the basic laws of microlasers as radiators on the linear-angular characteristics of existing measurement systems. The project is planned to conduct experimental studies aimed at identifying the impact of the application of the basic laws of microlasers as radiators on the linear-angular characteristics of existing measurement systems. The system consists of a distributed network-based layout, whose modularity allows to fit differently sized and shaped working volumes by adequately increasing the number of sensing units. Differently from existing spatially distributed metrological instruments, the remote sensor devices are intended to provide embedded data elaboration capabilities, in order to share the overall computational load.
© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Dmitriy Redka, Alexsandr S. Grishkanich, Egor Kolmakov, and Konstantin Tsvetkov "Speed scanning system based on solid-state microchip laser for architectural planning", Proc. SPIE 10431, Remote Sensing Technologies and Applications in Urban Environments II, 104310Z (6 October 2017); https://doi.org/10.1117/12.2280015
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KEYWORDS
Calibration

Metrology

Sensors

3D metrology

Laser systems engineering

Solid state lasers

Imaging systems

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