Paper
16 October 2017 Measurement of strongly curved surfaces by multi-beam experimental ray tracing
David Hilbig, Jan Schulze, F. Fleischmann, T. Henning
Author Affiliations +
Proceedings Volume 10448, Optifab 2017; 104482D (2017) https://doi.org/10.1117/12.2279799
Event: SPIE Optifab, 2017, Rochester, New York, United States
Abstract
Experimental ray tracing (ERT) is a proven method for transmission testing of various optical components providing a wide range of optical performance parameters from a single measurement. In this work, we demonstrate how this technique can be enabled for testing strongly curved specular surfaces in reflection with an emphasis on increased dynamic range. The surface under test (SUT) is scanned by a beam of light. The direction of the beam after reflection from the surface is detected from intersection with two parallel imaging planes yielding a gradient that will be transferred to a set of surface slopes and finally yield the actual surface profile. Dynamic range can be increased by using multiple beams in an appropriate arrangement to cover different slopes regimes of the surface shape by different beams. The derivation from ray slope to surface profile is discussed in detail as well as a suitable method to determine the angle of the incident ray, which is needed in the analysis. Simulations of strong spheres and extreme apsheres are used to demonstrate the functionality of the introduced method. The discussion is finished with the first results from an experimental setup.
© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
David Hilbig, Jan Schulze, F. Fleischmann, and T. Henning "Measurement of strongly curved surfaces by multi-beam experimental ray tracing", Proc. SPIE 10448, Optifab 2017, 104482D (16 October 2017); https://doi.org/10.1117/12.2279799
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Ray tracing

Sensors

Spherical lenses

Image sensors

Aspheric lenses

Optical testing

Back to Top