Paper
24 October 2017 Refractive index measurement based on confocal method
Zhe An, XiPing Xu, JinHua Yang, Yang Qiao, Yang Liu
Author Affiliations +
Proceedings Volume 10460, AOPC 2017: Optoelectronics and Micro/Nano-Optics; 1046011 (2017) https://doi.org/10.1117/12.2284455
Event: Applied Optics and Photonics China (AOPC2017), 2017, Beijing, China
Abstract
The development of transparent materials is closed to optoelectronic technology. It plays an increasingly important role in various fields. It is not only widely used in optical lens, optical element, optical fiber grating, optoelectronics, but also widely used in the building material, pharmaceutical industry with vessel, aircraft windshield and daily wear glasses.Regard of solving the problem of refractive index measurement in optical transparent materials. We proposed that using the polychromatic confocal method to measuring the refractive index of transparent materials. In this article, we describes the principle of polychromatic confocal method for measuring the refractive index of glass,and sketched the optical system and its optimization. Then we establish the measurement model of the refractive index, and set up the experimental system. In this way, the refractive index of the glass has been calibrated for refractive index experiment. Due to the error in the experimental process, we manipulated the experiment data to compensate the refractive index measurement formula. The experiment taking the quartz glass for instance. The measurement accuracy of the refractive index of the glass is ±1.8×10-5. This method is more practical and accurate, especially suitable for non-contact measurement occasions, which environmental requirements is not high. Environmental requirements are not high, the ordinary glass production line up to the ambient temperature can be fully adapted. There is no need for the color of the measured object that you can measure the white and a variety of colored glass.
© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zhe An, XiPing Xu, JinHua Yang, Yang Qiao, and Yang Liu "Refractive index measurement based on confocal method", Proc. SPIE 10460, AOPC 2017: Optoelectronics and Micro/Nano-Optics, 1046011 (24 October 2017); https://doi.org/10.1117/12.2284455
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