Electro-Optical Detector Laser Susceptibility Testing

Dennis L. McCormack; Billy D. Heady; David L. Haavig

doi:10.1117/12.951439

30 June 1989 Electro-Optical Detector Laser Susceptibility Testing

Dennis L. McCormack, Billy D. Heady, David L. Haavig

Proceedings Volume 1050, Infrared Systems and Components III; (1989) https://doi.org/10.1117/12.951439
Event: OE/LASE '89, 1989, Los Angeles, CA, United States

Abstract

McDonnell Douglas Corporation is involved in programs to improve survivability of electro-optic sensor systems that can be exposed to laser irradiation, from sources such as range finders and designators. The most vulnerable system components are the detectors. The detector damage level thus determines the system susceptibility. The system's detector susceptibility is tested initially with the detectors separate from the sensor system hardware. The McDonnell Douglas High Energy Laser Test Facility (HELTF) used for testing detectors is located in St.Louis Mo. It includes 23 lasers, computer controlled data acquisition systems, and thermal-vacuum test chambers. This facility has been used to characterize detector laser susceptibility for 13 years. Photo-conductive and photo-voltaic detectors have been tested from visible to long wave infrared wavelengths. The HELTF facility and detector susceptibility test techniques, including beam mapping and ensquared energy measurement techniques, are described in detail. Detector damage mechanisms are also discussed.

Citation Download Citation

Dennis L. McCormack, Billy D. Heady, and David L. Haavig "Electro-Optical Detector Laser Susceptibility Testing", Proc. SPIE 1050, Infrared Systems and Components III, (30 June 1989); https://doi.org/10.1117/12.951439

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