Paper
5 March 2018 Toward performing angular rotating measure of Heisenberg scaling by using the four-photon Holland-Burnett state
Jiandong Zhang, Zijing Zhang, Longzhu Cen, Shuo Li, Feng Wang, Yuan Zhao
Author Affiliations +
Proceedings Volume 10710, Young Scientists Forum 2017; 1071002 (2018) https://doi.org/10.1117/12.2303474
Event: Young Scientists Forum 2017, 2017, Shanghai, China
Abstract
Quantum process tomography, as an advanced means of metrology, has a capacious range of applications for estimating numerous meaningful parameters. The parameter estimate precision of using coherent state and single photon state as probe are limited by the shot noise limit. Here we demonstrate a quantum enhanced rotating angle measure scheme based on the four-photon Holland-Burnett state can achieve the Heisenberg scaling by the coincidence counting technology. At the same time, the output signal of our scheme has an 8-fold super-resolution compared to the Malus law. In addition, the accuracy achieved by four photons is consistent with using 12 photons of single photon probe. That has incomparable preponderance in a situation in which only weak light can be exploited, like the measure of frangible biological specimens and photosensitive crystals. Moreover, the four-photon Holland-Burnett state can be generated by a polarization-entangled light source. These ensure that our scheme has a champaign application prospect.
© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jiandong Zhang, Zijing Zhang, Longzhu Cen, Shuo Li, Feng Wang, and Yuan Zhao "Toward performing angular rotating measure of Heisenberg scaling by using the four-photon Holland-Burnett state", Proc. SPIE 10710, Young Scientists Forum 2017, 1071002 (5 March 2018); https://doi.org/10.1117/12.2303474
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Photons

Signal detection

Single photon

Polarization

Metrology

Sensors

Super resolution

Back to Top