One shot projected fringe profilometry using a 2D fringe-encoded pattern

Wei-Hung Su; Sih-Yue Chen

doi:10.1117/12.2323809

4 September 2018 One shot projected fringe profilometry using a 2D fringe-encoded pattern

Wei-Hung Su, Sih-Yue Chen

Proceedings Volume 10755, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XII; 1075511 (2018) https://doi.org/10.1117/12.2323809
Event: SPIE Optical Engineering + Applications, 2018, San Diego, California, United States

Abstract

A one-shot technique for profile measurements is presented. A two-dimensional deinge-encoded pattern is used to illuminate the inspected object and a monochromatic camera is employed to observe the deformed fringes at another view angle. The 2D fringe-encoded pattern provides additional information to identify the fringe order. Even though the surface color or reflectivity varies rapidly with positions, it distinguishes the fringe order very well.

Citation Download Citation

Wei-Hung Su and Sih-Yue Chen "One shot projected fringe profilometry using a 2D fringe-encoded pattern", Proc. SPIE 10755, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XII, 1075511 (4 September 2018); https://doi.org/10.1117/12.2323809

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