Paper
1 October 2018 Charge cluster identification for multidimensional GEM detector structures
T. Czarski, M. Chernyshova, K. Malinowski, P. Linczuk, E. Kowalska-Strzeciwilk, K. T. Pozniak, G. Kasprowicz, P. Kolasinski, R. Krawczyk, A. Wojenski, W. Zabolotny
Author Affiliations +
Proceedings Volume 10808, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2018; 108084E (2018) https://doi.org/10.1117/12.2502156
Event: Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2018, 2018, Wilga, Poland
Abstract
The measurement system based on GEM - Gas Electron Multiplier detector - is developed for soft X-ray diagnostics of tokamak plasmas. The multi-channel setup is designed for estimation of the energy and the position distribution of an Xray source. The focal measuring issue is the charge cluster identification by its value and position estimation. The fast and accurate mode of the serial data acquisition is applied for the dynamic plasma diagnostics. The charge clusters are counted in the space determined by 2D position, charge value and time intervals. Radiation source characteristics are presented by histograms for a selected range of position, time intervals and cluster charge values corresponding to the energy spectra.
© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
T. Czarski, M. Chernyshova, K. Malinowski, P. Linczuk, E. Kowalska-Strzeciwilk, K. T. Pozniak, G. Kasprowicz, P. Kolasinski, R. Krawczyk, A. Wojenski, and W. Zabolotny "Charge cluster identification for multidimensional GEM detector structures", Proc. SPIE 10808, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2018, 108084E (1 October 2018); https://doi.org/10.1117/12.2502156
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Sensors

X-rays

Plasma

Spatial resolution

Clocks

Data acquisition

Data processing

Back to Top