Presentation + Paper
22 April 2019 Chromatic line confocal technology in high-speed 3D surface-imaging applications
Author Affiliations +
Proceedings Volume 10925, Photonic Instrumentation Engineering VI; 109250O (2019) https://doi.org/10.1117/12.2507962
Event: SPIE OPTO, 2019, San Francisco, California, United States
Abstract
FocalSpec chromatic line confocal sensor technology is presented. Performance of the technology is described in terms of z-precision and accuracy. We report on the latest technical developments that improve the measuring speed by 6x. With these developments we are able to deliver sub-micron precise 3D point clouds with speeds up to 24 Million points per second. Potential applications are discussed.
Conference Presentation
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Karri Niemelä "Chromatic line confocal technology in high-speed 3D surface-imaging applications ", Proc. SPIE 10925, Photonic Instrumentation Engineering VI, 109250O (22 April 2019); https://doi.org/10.1117/12.2507962
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KEYWORDS
Sensors

Confocal microscopy

Inspection

3D metrology

3D applications

3D image processing

Glasses

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