Background Characterization Techniques For Pattern Recognition Applications

Meg A. Noah; Paul V. Noah; John Schroeder; B. V. Kessler; Julian Chernick

doi:10.1117/12.960425

30 August 1989 Background Characterization Techniques For Pattern Recognition Applications

Meg A. Noah, Paul V. Noah, John Schroeder, B. V. Kessler, Julian Chernick

Proceedings Volume 1098, Aerospace Pattern Recognition; (1989) https://doi.org/10.1117/12.960425
Event: SPIE 1989 Technical Symposium on Aerospace Sensing, 1989, Orlando, FL, United States

Abstract

The Department of Defense has a requirement to investigate technologies for the detection of air and ground vehicles in a clutter environment. The use of autonomous systems using infrared, visible, and millimeter wave detectors has the potential to meet DOD's needs. In general, however, the hard-ware technology (large detector arrays with high sensitivity) has outpaced the development of processing techniques and software. In a complex background scene the "problem" is as much one of clutter rejection as it is target detection. The work described in this paper has investigated a new, and innovative, methodology for background clutter characterization, target detection and target identification. The approach uses multivariate statistical analysis to evaluate a set of image metrics applied to infrared cloud imagery and terrain clutter scenes. The techniques are applied to two distinct problems: the characterization of atmospheric water vapor cloud scenes for the Navy's Infrared Search and Track (IRST) applications to support the Infrared Modeling Measurement and Analysis Program (IRAMMP); and the detection of ground vehicles for the Army's Autonomous Homing Munitions (AHM) problems. This work was sponsored under two separate Small Business Innovative Research (SBIR) programs by the Naval Surface Warfare Center (NSWC), White Oak MD, and the Army Material Systems Analysis Activity at Aberdeen Proving Ground MD. The software described in this paper will be available from the respective contract technical representatives.

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Meg A. Noah, Paul V. Noah, John Schroeder, B. V. Kessler, and Julian Chernick "Background Characterization Techniques For Pattern Recognition Applications", Proc. SPIE 1098, Aerospace Pattern Recognition, (30 August 1989); https://doi.org/10.1117/12.960425

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