Polarization to estimate leaf surface reflectance

Vern Vanderbilt; Craig Daughtry; Robert Dahlgren

doi:10.1117/12.2529214

6 September 2019 Polarization to estimate leaf surface reflectance

Vern Vanderbilt, Craig Daughtry, Robert Dahlgren

Proceedings Volume 11132, Polarization Science and Remote Sensing IX; 1113205 (2019) https://doi.org/10.1117/12.2529214
Event: SPIE Optical Engineering + Applications, 2019, San Diego, California, United States

Abstract

The Photochemical Reflectance Index (PRI) provides insight remote sensing into plant physiological processes occurring at leaf to canopy scales. We have found that PRI displays greater sensitivity to these processes if redefined to exclude the leaf surface reflectance. Here we suggest our published method for estimating leaf surface reflectance using linear polarizers underestimates the actual leaf surface reflectance. We suggest part of the leaf volume reflectance obtained using our published method represents light diffusely scattered by the leaf surface. We propose here a modification to our published method in order to obtain estimates of vPRI that are presumably more sensitive to leaf photochemistry.

Citation Download Citation

Vern Vanderbilt, Craig Daughtry, and Robert Dahlgren "Polarization to estimate leaf surface reflectance", Proc. SPIE 11132, Polarization Science and Remote Sensing IX, 1113205 (6 September 2019); https://doi.org/10.1117/12.2529214

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