Measurement Of The Refractive-Index Structure Parameter By Incoherent Aperture Scintillation Techniques

Gerard R. Ochs

doi:10.1117/12.960863

11 October 1989 Measurement Of The Refractive-Index Structure Parameter By Incoherent Aperture Scintillation Techniques

Gerard R. Ochs

Proceedings Volume 1115, Propagation Engineering; (1989) https://doi.org/10.1117/12.960863
Event: SPIE 1989 Technical Symposium on Aerospace Sensing, 1989, Orlando, FL, United States

Abstract

The current status of large aperture scintillation techniques for refractive index structure parameter measurement is reviewed, instrument design considerations and limitations are discussed, and a new incoherent aperture profiling system is described.

Citation Download Citation

Gerard R. Ochs "Measurement Of The Refractive-Index Structure Parameter By Incoherent Aperture Scintillation Techniques", Proc. SPIE 1115, Propagation Engineering, (11 October 1989); https://doi.org/10.1117/12.960863

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