Paper
29 August 2019 Towards a visualization of deep neural networks for rough line images
Narendra Chaudhary, Serap A. Savari
Author Affiliations +
Proceedings Volume 11177, 35th European Mask and Lithography Conference (EMLC 2019); 111770S (2019) https://doi.org/10.1117/12.2535667
Event: 35th European Mask and Lithography Conference, 2019, Dresden, Germany
Abstract
Low dose scanning electron microscope (SEM) images are an attractive option to estimate the roughness of nanos- tructures. We recently proposed two deep convolutional neural network (CNN) architectures named “LineNet” to simultaneously perform denoising and edge estimation on rough line SEM images. In this paper we consider multiple visualization tools to improve our understanding of LineNet1; one of these techniques is new to the visualization of denoising CNNs. We use the resulting insights from these visualizations to motivate a study of two variations of LineNet1 with fewer neural network layers. Furthermore, although in classification CNNs edge detection is commonly believed to happen early in the network, the visualization techniques suggest that important aspects of edge detection in LineNet1 occur late in the network.
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Narendra Chaudhary and Serap A. Savari "Towards a visualization of deep neural networks for rough line images", Proc. SPIE 11177, 35th European Mask and Lithography Conference (EMLC 2019), 111770S (29 August 2019); https://doi.org/10.1117/12.2535667
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Cited by 1 scholarly publication.
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KEYWORDS
Visualization

Scanning electron microscopy

Image filtering

Denoising

Image processing

Edge detection

Line edge roughness

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