|
In this paper, we analyse the potential of non-redundant aperture masking for spectral measurements, highlighting its capabilities both as a tool for precise single-wavelength metrology, and as alternative to low resolution spectrographs. Although here presented as a general introduction, this technique is suitable for a large number of potential applications, ranging from compact cube-sat missions for the analysis of bright sources, to large-dish space telescopes where the increased sensitivity allows one to study fainter targets. |
Calibration
Spectral resolution
Krypton
Sensors
Interferometry
Lamps
Optical components
