Paper
16 October 2019 Phase-shifting ESPI micro-deformation testing algorithm and experimental research
Author Affiliations +
Proceedings Volume 11205, Seventh International Conference on Optical and Photonic Engineering (icOPEN 2019); 112050D (2019) https://doi.org/10.1117/12.2542173
Event: Seventh International Conference on Optical and Photonic Engineering (icOPEN 2019), 2019, Phuket, Thailand
Abstract
Electronic Speckle Interferometry (ESPI) is a common method for deformation measurements by introducing a phase shift technique. The traditional method needs to subtract the distribution of the phase before and after deformation to get the deformation information. During this process, the noise of the object wavefront will partially remain in the deformation signal. In order to solve this problem, this paper proposes a 5+5 phase-shifting algorithm to suppress the influence of the error from the calculation. In this algorithm, the deformed phase map is directly obtained by combining the interferograms before and after the deformation. Several experiments have been carried out to verify this method. Finally, the results show a better characteristic to quantify deformation than the traditional method. In addition, the algorithm also has better redundancy
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hanyue Su, Yingjie Yu, and Dingfu Chen "Phase-shifting ESPI micro-deformation testing algorithm and experimental research", Proc. SPIE 11205, Seventh International Conference on Optical and Photonic Engineering (icOPEN 2019), 112050D (16 October 2019); https://doi.org/10.1117/12.2542173
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KEYWORDS
Phase shifts

Speckle

Speckle interferometry

Charge-coupled devices

Ferroelectric materials

Phase shifting

Light scattering

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