CONFERENCE PROCEEDINGS
Advanced Search
Home > Proceedings > Volume 11245 > Article
Presentation
9 March 2020 Physics-based learning for measurement diversity in 3D refractive index microscopy (Conference Presentation)
Regina Eckert, Michael R. Kellman, Laura Waller
Author Affiliations +
Proceedings Volume 11245, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXVII; 112450X (2020) https://doi.org/10.1117/12.2543402
Event: SPIE BiOS, 2020, San Francisco, California, United States
Abstract
3D refractive index imaging methods usually rely on a weak-scattering approximation that does not allow for thick samples to be imaged accurately. Recent methods such as 3D Fourier ptychographic microscopy (FPM) instead use multiple-scattering models which allow for thicker objects to be imaged. In practice the illumination-side coding of 3D FPM requires redundant information and may produce inaccurate reconstructions for thick samples. Here, we propose augmenting 3D FPM with detection-side coding using a spatial light modulator (SLM) and optimize the SLM coding strategy with physics-based machine learned pupil coding designs that are optimized for 3D reconstructions. We compare our learned designs to random-, defocus-, Zernike aberrations-based pupil codes in simulated and experimental results.
Conference Presentation
© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Citation Download Citation
Regina Eckert, Michael R. Kellman, and Laura Waller "Physics-based learning for measurement diversity in 3D refractive index microscopy (Conference Presentation)", Proc. SPIE 11245, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXVII, 112450X (9 March 2020); https://doi.org/10.1117/12.2543402
ACCESS THE FULL ARTICLE
ORGANIZATIONAL
Sign in with credentials provided by your organization.
INSTITUTIONAL
Select your institution to access the SPIE Digital Library.
SELECT YOUR INSTITUTION
PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
PERSONAL SIGN IN
No SPIE Account? Create one
PURCHASE THIS CONTENT
SUBSCRIBE TO DIGITAL LIBRARY
50 downloads per 1-year subscription
Members: $195
Non-members: $335 ADD TO CART
25 downloads per 1 - year subscription
Members: $145
Non-members: $250 ADD TO CART
PURCHASE SINGLE ARTICLE
Includes PDF, HTML & Video, when available
Members: $17.00
Non-members: $21.00 ADD TO CART
PROCEEDINGS
 PRESENTATION
WATCH
PRESENTATION SAVE TO MY LIBRARY
GET CITATION
Advertisement
Advertisement
KEYWORDS
3D metrology
3D modeling
Refractive index
3D image processing
Microscopy
Stereoscopy
Algorithm development
RELATED CONTENT
Subscribe to Digital Library
Receive Erratum Email Alert
Back to Top