Direct, real-time, high-resolution beam profiler for high-power laser

M. Tsunekane; K. Sato; T. Takahashi; S. Yoshino; N. Yoshimori; J. Ohno

doi:10.1117/12.2543354

2 March 2020 Direct, real-time, high-resolution beam profiler for high-power laser

M. Tsunekane, K. Sato, T. Takahashi, S. Yoshino, N. Yoshimori, J. Ohno

Proceedings Volume 11273, High-Power Laser Materials Processing: Applications, Diagnostics, and Systems IX; 1127307 (2020) https://doi.org/10.1117/12.2543354
Event: SPIE LASE, 2020, San Francisco, California, United States

Abstract

Fluorescence Imaging technology combined with a thin, linear-response fluorescent plate and a camera was developed for real-time 2D beam profiling of a raw beam of a high-power laser in the wavelength range from blue to near infrared. The input laser beam was slightly absorbed on the fluorescent plate in front top of the profiler body and generated 2D fluorescence image, that was precise reproduction of the laser beam profile at the place, was reimaged by a camera at the back side of the profiler. The laser beam that transferred the fluorescent plate was separated by a dichroic mirror and outputted from the body. >99% energy of the input laser beam transferred the fluorescent plate, then the heat generation in the fluorescent plate was very low. This made long-time, stable measurement of the high power, raw laser beam profile possible. >2MW/cm² damage threshold of the fluorescent plate and the efficient heat management made direct measurement of >100W laser beam profiles possible without any attenuators and any computer-aided image reconstructions. Speckle-free and interference fringe-free, high-resolution images were also successfully obtained by the incoherent fluorescence reimaging.

Conference Presentation

Citation Download Citation

M. Tsunekane, K. Sato, T. Takahashi, S. Yoshino, N. Yoshimori, and J. Ohno "Direct, real-time, high-resolution beam profiler for high-power laser", Proc. SPIE 11273, High-Power Laser Materials Processing: Applications, Diagnostics, and Systems IX, 1127307 (2 March 2020); https://doi.org/10.1117/12.2543354

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