Presentation + Paper
13 December 2020 A study of the silicon divacancy defect in the E2V LSST CCD250 using the single trap pumping method
Author Affiliations +
Abstract
Charge-coupled devices (CCDs) currently constitute the standard detector for precision astronomical telescopes such as the Large Synoptic Survey Telescope (LSST) due to their high linearity, sensitivity and dynamic range. Charge transfer properties can however be degraded by the presence of defect levels in the silicon band-gap, which can act as trapping centers for signal charge. The technique of single trap-pumping can be used as a tool to probe the underlying properties of relevant defect levels and potentially mitigate against their effects. In this paper we present a single trap-pumping study of the LSST E2V CCD250 across a temperature range of -30◦ to -110◦, a much larger range than previously studied using this approach. The predominant defect level of relevance for CCDs appearing at these temperatures is shown to be the single-acceptor level of the silicon divacancy. Using experimental data and a basic Monte-Carlo model of the trap-pumping process we examine the defect level properties, with an attempt made to account for both the capture and emission of signal charge.
Conference Presentation
© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
D. Wood, D. P. Weatherill, I. P. J. Shipsey, R. Plackett, A. Loreti, K. Metodiev, M. Mironova, and D. Bortoletto "A study of the silicon divacancy defect in the E2V LSST CCD250 using the single trap pumping method", Proc. SPIE 11454, X-Ray, Optical, and Infrared Detectors for Astronomy IX, 114540B (13 December 2020); https://doi.org/10.1117/12.2561561
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KEYWORDS
Silicon

Charge-coupled devices

Large Synoptic Survey Telescope

CCD image sensors

Crystals

Energy efficiency

Optical sensors

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