An approach to metric rectification using sequential estimation of spatial adjacent planes appeared in single view image

Haruka Kurose; Akio Kimura

doi:10.1117/12.2566609

1 June 2020 An approach to metric rectification using sequential estimation of spatial adjacent planes appeared in single view image

Haruka Kurose, Akio Kimura

Author Affiliations +

Proceedings Volume 11515, International Workshop on Advanced Imaging Technology (IWAIT) 2020; 115150C (2020) https://doi.org/10.1117/12.2566609
Event: International Workshop on Advanced Imaging Technologies 2020 (IWAIT 2020), 2020, Yogyakarta, Indonesia

Abstract

In this paper, we propose a metric (Euclidean) rectification method for a target spatial plane showed up in a single viewpoint image. Our approach is realized from a homography matrix calculated without using four points correspondence, unlike general well-known metric rectification methods. The method first estimates a projection matrix for the pre-defined world coordinate system on a specific plane regarded as the base one, and then sequentially estimates adjacent spatial planes appeared in the input image, using our previous method.¹Once our method can estimate the target plane, the world coordinate system on the base plane is moved to on the estimated target plane, and it is regarded as the new world coordinate system. By doing this, it can be showed that the homography matrix for the target plane is calculated only from the original projection matrix and the transformation parameters between the old and the new world coordinate systems (rotation and translation). Finally, metric rectification can be realized using the calculated homography matrix; i.e., the proposed method can obtain 3D information such as length and angle on a plane where four-point correspondence is not easily determined, only using a single view image. Experimental results showed the validity and effectiveness of our approach.

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Haruka Kurose and Akio Kimura "An approach to metric rectification using sequential estimation of spatial adjacent planes appeared in single view image", Proc. SPIE 11515, International Workshop on Advanced Imaging Technology (IWAIT) 2020, 115150C (1 June 2020); https://doi.org/10.1117/12.2566609

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KEYWORDS

Error analysis

3D modeling

Mendelevium

3D metrology

Image segmentation

3D image restoration

3D vision

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