Abstract
This PDF file contains the front matter associated with SPIE Proceedings Volume 11523, including the Title Page, Copyright information, and Table of Contents.
© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
"Front Matter: Volume 11523", Proc. SPIE 11523, Optical Technology and Measurement for Industrial Applications 2020, 1152301 (15 June 2020); https://doi.org/10.1117/12.2574753
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KEYWORDS
Optical testing

Imaging systems

Lutetium

Current controlled current source

Fringe analysis

Geometrical optics

Inspection

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