Open Access Paper
24 June 2020 Front Matter: Volume 11526
Proceedings Volume 11526, Fifth International Workshop on Pattern Recognition; 1152601 (2020) https://doi.org/10.1117/12.2575771
Event: Fifth International Workshop on Pattern Recognition, 2020, Chengdu, China
Abstract
This PDF file contains the front matter associated with SPIE Proceedings Volume 11526, including the Title Page, Copyright information, and Table of Contents.

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Author(s), “Title of Paper,” in Fifth International Workshop on Pattern Recognition, edited by Xudong Jiang, Chuan Zhang, Yinglei Song, Proceedings of SPIE Vol. 11526 (SPIE, Bellingham, WA, 2020) Seven-digit Article CID Number.

ISSN: 0277-786X

ISSN: 1996-756X (electronic)

ISBN: 9781510638631

ISBN: 9781510638648 (electronic)

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Authors

Numbers in the index correspond to the last two digits of the seven-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first five digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc.

Azeem, Abdullah, 0I

Bai, Hao, 09

Cai, Yihao, 0A

Chen, Jian, 0C

Chen, Jianxin, 0A

Chen, Lei, 0D

Chen, Liyan, 0J

Chen, Min, 0E

Chen, Shuai, 05

Chen, Yanbin, 07

Chen, Yujia, 06

Cheng, Wei, 0F

Cheng, X., 0G

Ding, Hui, 08

Fang, Bin, 02

Gao, Huiyi, 0D

Ge, Hailong, 0F

Han, Qiyi, 0B

Han, Zhuo, 07

Honda, M., 0G

Ikenaga, T., 0G

Jiang, Bo, 0H

Jin, Shuo, 0F

Li, Jie, 05

Li, Wenlong, 0F

Liang, Ying, 0B

Lin, Lu, 0J

Lin, Weiqiang, 0J

Liu, Xiaoning, 06

Ma, Jie, 02

Ma, Xinqiang, 0F

Ma, Yuanyuan, 08

Niu, Dongmei, 03

Ren, Yuan, 0F

Riaz, Waqar, 0I

Saifullah, Tahir Junaid, 0I

Siddique, Abubakar, 0I

Sun, Wei, 04

Tian, L., 0G

Wang, Beizhan, 0J

Wang, Chongwen, 06

Wang, Huai, 07

Wang, Jianyu, 0A

Wang, Jin, 0B

Wang, Wentao, 0F

Wu, Bingli, 02

Wu, Yue, 0D

Xiao, Yingchao, 08

Xie, Xiaojie, 0J

Xu, Hong, 0H

Xu, Qiucheng, 08

Yin, Zhaoning, 03

You, Lei, 0B

Yu, Kun, 02

Yu, Yibiao, 04, 0E

Zhang, Hongzhen, 0H

Zhang, Jingle, 05

Zhang, Sen, 05

Zhang, Xi-Wen, 09

Zhao, Chunyu, 03

Zhao, Xiuyang, 03

Conference Committee

Conference Chairs

  • Xudong Jiang, Nanyang Technological University (Singapore)

  • Chuan Zhang, Southeast University (China)

  • Yinglei Song, Jiangsu University of Science and Technology (China)

International Advisory Committee

  • Prof. Yiu-ming Cheung, Hong Kong Baptist University (Hong Kong)

Program Chairs

  • Prof. Yibiao Yu, Soochow University (China)

  • Prof. Yinwei Zhan, Guangdong University of Technology (China)

  • Prof. Tieling Chen, University of South Carolina Aiken (United States)

  • Prof. Pedro Furtado, Universidade de Coimbra (Portugal)

  • Prof. Giovanni Maria Farinella, Università degli Studi di Catania (Italy)

Steering Committee

  • Prof. Chuan Zhang, Southeast University (China)

  • Prof. Yinglei Song, Jiangsu University of Science and Technology (China)

Publicity Chairs

  • Prof. Masayuki Arai, Teikyo University (Japan)

  • Assoc. Prof. Kin Choong Yow, University of Regina (Canada)

Publication Chair

  • Dr. Guojian Chen, Hainan University (China)

Technical Committee

  • Prof. Adam Krzyzak, Concordia University Centre for Pattern Recognition and Machine Intelligence (Canada)

  • Assoc. Prof. Bob Zhang, University of Macau (China)

  • Prof. Jie Yang, Shanghai Jiaotong University (China)

  • Prof. Mark Nixon, Southampton University (United Kingdom)

  • Prof. Lihong Connie Li, The City University of New York (United States)

  • Prof. Shiqian Wu, Wuhan University of Science and Technolog y (China)

  • Prof. Zengchang Qin, Beihang University (China)

  • Assoc. Prof. Xuebo Zhang, Science and Technology on Underwater Acoustic Antagonizing Laboratory (China)

  • Prof. Mohamed Daoudi, IMT Lille Douai (France)

  • Dr. Silvia Biasotti, Istituto di Matematica Applicata e Tecnologie Informatiche, (Italy)

  • Prof. Dr. Amine Nait-Ali, Signaux et Systèmes Intelligents (France)

  • Prof. Dr. Jan Sijbers, Universiteit Antwerpen (CDE) Universiteitsplein (Belguim)

  • Prof. Dr. Yudong Zhang, University of Leicester (United Kingdom)

  • Prof. Dr. Janos Abonyi, University of Pannonia (Hungary)

  • Dr. Cosimo Distante, Institute of Applied Sciences and Intelligent Systems (Italy)

  • Dr. Pufeng Du, Tianjin University (China)

  • Dr. Paolo Napoletano, Università degli Studi di Milano-Bicocca (Italy)

  • Dr. Minglun Gong, University of Guelph (Canada)

  • Dr. Barbara Zitova, Czech Academy of Sciences (Czech Republic)

  • Prof. Jibin Yang, PLA University of Science and Technology (China)

  • Prof. Changli Li, Hohai University (China)

  • Prof. Xiwen Zhang, Beijing Language and Culture University (China)

  • Dr. Jingjing Xiao, Xinqiao Hospital of Third Military Medical University (China)

  • Asst. Prof. Boran Şekeroğlu, Near East University (Turkey)

  • Dr. Mohammad Reza Khosravi, Shiraz University of Technology (Iran)

  • Dr. Birjodh Tiwana, Linkedin Inc. (United States)

  • Asst. Prof. M. Ali Akber Dewan, Athabasca University (Canada)

  • Prof. Bok-Min Goi, Universiti Tunku Abdul Rahman (Malaysia)

  • Dr. Nav Kesher, Facebook, Inc. (United States)

  • Dr. Abu Bakar Ibrahim, Universiti Pendidikan Sultan Idris (Malaysia)

  • Dr. Mayukha Pal, University of Hyderabad Campus (India)

  • Dr. Nitikarn Nimsuk, Thammasat University (Thailand)

  • Assoc. Prof. Luisito Lolong Lacatan, AMA University (Philippines)

  • Asst. Prof. Bhupendra Gupta, Indian Institute of Information Technology Disgn and Manufactruing Jabalpur (India)

  • Dr. Lei Meng, National University of Singapore (Singapore)

  • Assoc. Prof. Chih-Yi Chiu, National Chiayi University (Taiwan)

  • Dr. Nan Zhu, Xi’an Technological University (China)

  • Prof. Flordeliza L. Valiente, Mapua University (Philippines)

  • Asst. Prof. Wornchanok Chaiyasoonthorn, Faculty of Administration and Management King Mongkut’s Institute of Technology Ladkrabang (Thailand)

  • Assoc. Prof. Dr. Mohamed Arezki Mellal, M’Hamed Bougara University (Algeria)

  • Asst. Prof. Osama Halabi, Qatar University (Qatar)

  • Asst. Prof. Emre Sümer, Başkent University (Turkey)

  • Asst. Prof. Singha Chaveesuk, Faculty of Administration and Management King Mongkut’s Institute of Technology Ladkrabang, (Thailand)

  • Prof. Ravi Kothari, Ashoka University (India)

Session Chairs

  • 1 Image Processing Technology and Method

    Assoc. Prof. Kin Choong Yow, University of Regina (Canada)

  • 2 Computer Graphics and Image Processing

    Prof. Pedro Furtado, Universidade de Coimbra (Portugal)

Introduction

In recent years, pattern recognition has become a hot research topic thanks to recent advancements in deep machine learning driven by big data. In light of the fast-paced advancements in pattern recognition taking place all over the world, it is of great interest to keep an eye on state-of-the-art research and development and to facilitate collaboration in multidisciplinary research areas. With this end in mind, it’s a great pleasure for me to invite you to participate in the 5th International Workshop on Pattern Recognition during June 5-7, 2020.

As you have been aware, COVID-19 has evolved into a pandemic, and the safety and well-being of our participants is of paramount importance to us. Therefore, after serious consideration, the committee made the difficult decision to have IWPR 2020 as a fully virtual conference.

The aim of the conference is to address and deliberate on the latest technical status and recent trends in the research, development and application of pattern recognition. This conference has been designed with the view of providing an opportunity for scientists, engineers, industrialists, students, and other professionals from all over the world to interact and exchange their new ideas and research outcomes for future collaboration.

This year, IWPR solicited 31 submitted papers from various countries all over the world. The proceedings of IWPR 2020 contain 18 selected papers from the conference that have been presented at the virtual conference. They provide upto-date, comprehensive and worldwide state-of-the-art knowledge and techniques in this field. Each contributed paper was rigorously peer-reviewed by international reviewers in related fields from all over the world who were drawn from the organizing and advisory committee members. The proceedings cover the following specific areas: pattern recognition, target detection, image transformation and analysis, image detection technology and application, image processing and application, signal analysis and processing, and computer science and engineering.

On behalf of the organizing committee, we’d like to express our heartful gratitude to all the reviewers for their great professionalism and efforts and thank all the participants and sponsors for their valuable contributions and support of IWPR 2020.

General Chair

Prof. Xudong Jian

© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
"Front Matter: Volume 11526", Proc. SPIE 11526, Fifth International Workshop on Pattern Recognition, 1152601 (24 June 2020); https://doi.org/10.1117/12.2575771
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KEYWORDS
Pattern recognition

Image processing

Lithium

3D modeling

Current controlled current source

Electronics

Image analysis

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