Deep-learning-enabled fringe projection profilometry

Chao Zuo

doi:10.1117/12.2573579

10 October 2020 Deep-learning-enabled fringe projection profilometry

Chao Zuo

Proceedings Volume 11552, Optical Metrology and Inspection for Industrial Applications VII; 1155207 (2020) https://doi.org/10.1117/12.2573579
Event: SPIE/COS Photonics Asia, 2020, Online Only

Abstract

We introduce our recent work in deep-learning-based fringe projection profilometry (FPP), including phase retrieval, phase unwrapping, geometric constraint, color fringe demultiplexing, and high-dynamic-range imaging.

Conference Presentation

Citation Download Citation

Chao Zuo "Deep-learning-enabled fringe projection profilometry", Proc. SPIE 11552, Optical Metrology and Inspection for Industrial Applications VII, 1155207 (10 October 2020); https://doi.org/10.1117/12.2573579

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